DB-FIB
Hordhac Adeeg
Waqtigan xaadirka ah, DB-FIB (Dual Beam Focused Ion Beam) ayaa si weyn loogu dabaqay cilmi-baarista iyo kormeerka alaabta ee dhinacyada sida:
Agabka dhoobadaPolymersQalabka birta ahCilmi-baarista nafleydaSemiconductorsGeology
Baaxadda adeegga
Walxaha Semiconductor, Walxaha molecule yar yar ee dabiiciga ah, Walxaha polymer, Walxaha isku-dhafan ee organic/aan-organic, walxo aan bir ahayn
Asalkii hore Adeegga
Horumarka degdega ah ee qalabka elektiroonigga ah ee semiconductor iyo tignoolajiyada isku dhafan ee wareegga, kakanaanta sii kordheysa ee aaladaha iyo qaab dhismeedka wareegga ayaa kor u qaaday shuruudaha baaritaanka geeddi-socodka microelectronic, falanqaynta fashilka, iyo abuuritaanka micro/nano.Nidaamka Dual Beam FIB-SEM, oo leh qalabkeeda saxda ah ee saxda ah iyo awoodaha falanqaynta microscopic, waxay noqotay mid aan lagama maarmaan u ah naqshadeynta microelectronic iyo wax soo saarka.
Nidaamka Dual Beam FIB-SEMwuxuu isku daraa labadaba Ion Beam (FIB) iyo Microscope Electron Scanning (SEM). Waxay awood u siineysaa waqtiga-dhabta ah ee SEM ee hababka micromachining-ku-saleysan FIB, isku darka xallinta sare ee xajmiga elektarooniga ah iyo awoodda wax-qabad ee saxda ah ee ion beam.
Alaabta adeegga
Goobta-Diyaarinta Qaybta Isku-tallaabta Gaarka ah
TEM Tusaalaha Sawirka iyo Falanqaynta
SKormeerka Etching ee la doortay
MTijaabinta Dhigista lakabka etal iyo dahaarka
la xidhiidhaAlaabooyinka
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