Iyada oo horumarinta joogtada ah ee wareegyada isku dhafan ee baaxadda weyn, habka wax-soo-saarka chip wuxuu noqonayaa mid aad iyo aad u adag, iyo qaab-dhismeedka aan caadiga ahayn ee microstructure iyo ka kooban yahay qalabka semiconductor ayaa caqabad ku ah hagaajinta wax-soo-saarka chip, taas oo keeneysa caqabado waaweyn hirgelinta semiconductor cusub iyo isku dhafan. farsamada wareegga.
GRGTEST waxay bixisaa falanqeynta iyo qiimeynta walxaha semiconductor-ka oo dhameystiran si ay uga caawiso macaamiisha inay hagaajiyaan semiconductor iyo hababka wareegga isku dhafan, oo ay ku jiraan diyaarinta astaanta heerka wafer iyo falanqaynta elektaroonigga ah, falanqaynta guud ee sifooyinka jirka iyo kiimikaadka ee qalabka wax soo saarka semiconductor, samaynta iyo hirgelinta falanqaynta wasakheynta walxaha semiconductor barnaamijka.
Walxaha Semiconductor, Walxaha molecule yar yar ee organic, Walxaha polymer, Walxaha isku-dhafan ee organic/aan-organic, walxo aan bir ahayn
1. Diyaarinta profile heerka Chip wafer iyo falanqaynta elektaroonigga ah, oo ku salaysan tignoolajiyada ion beam technology (DB-FIB), goynta saxda ah ee aagga deegaanka ee chip-ka, iyo sawirka elektiroonigga ah ee waqtiga-dhabta ah, waxay heli kartaa qaab-dhismeedka astaanta chip-ka, halabuurka iyo kuwa kale macluumaadka habka muhiimka ah;
2. Falanqaynta dhamaystiran ee sifooyinka jirka iyo kiimikooyinka ee qalabka wax soo saarka semiconductor, oo ay ku jiraan qalabka polymer organic, walxaha molecule yar yar, falanqaynta ka kooban walxaha aan organic-ga ah ee aan biraha ahayn, falanqaynta qaab-dhismeedka molecular, iwm;
3. Samaynta iyo hirgelinta qorshaha falanqaynta wasakhaysan ee qalabka semiconductor.Waxay ka caawin kartaa macaamiisha inay si buuxda u fahmaan sifooyinka jidheed iyo kiimikaad ee wasakhowga, oo ay ku jiraan: falanqaynta ka kooban kiimikada, falanqaynta nuxurka, falanqaynta qaabdhismeedka kelli iyo falanqaynta sifooyinka kale ee jirka iyo kiimikaad.
Adeegganooca | Adeeggaalaabta |
Falanqaynta halabuurka aasaasiga ah ee walxaha semiconductor | l falanqaynta aasaasiga ah ee EDS, l X-ray photoelectron spectroscopy (XPS) falanqaynta aasaasiga ah |
Falanqaynta qaab-dhismeedka molecular ee walxaha semiconductor | l FT-IR infrared spectrum falanqaynta, l X-ray diffraction (XRD) spectroscopic falanqaynta, l Falanqaynta dib-u-celinta dib-u-celinta nukliyeerka (H1NMR, C13NMR) |
Falanqaynta qaab-dhismeed-yar ee alaabta semiconductor | l Falanqaynta jeexjeexa labajibbaaran ee ion beam (DBFIB), l Sawirka qiiqa hawada ee mikroskoobyada elektaroonigga ah (FESEM) ayaa loo isticmaalay in lagu cabbiro oo lagu eego qaab-dhismeedka microscopic, l Mikroskoobyada xoogga atomiga (AFM) ee fiirsashada morphology ee dusha sare |