Iyada oo horumarinta joogtada ah ee wareegyada isku dhafan ee baaxadda weyn, habka wax-soo-saarka chip wuxuu noqonayaa mid aad iyo aad u adag, iyo qaab-dhismeedka aan caadiga ahayn ee microstructure iyo ka kooban yahay qalabka semiconductor waxay caqabad ku yihiin hagaajinta wax-soo-saarka chip, taas oo keeneysa caqabado waaweyn hirgelinta semiconductor cusub iyo teknoolajiyada wareegga isku dhafan.
GRGTEST waxay bixisaa falanqeynta iyo qiimeynta walxaha semiconductor-ka dhamaystiran si ay u caawiyaan macaamiisha hagaajinta semiconductor iyo hababka wareegga isku dhafan, oo ay ku jiraan diyaarinta heerka wafer profile iyo falanqaynta elektaroonigga ah, falanqaynta dhamaystiran ee sifooyinka jireed iyo kiimikaad ee wax soo saarka semiconductor la xiriira, samaynta iyo hirgelinta barnaamijka falanqaynta wasakhaysan walxaha semiconductor.
Walxaha Semiconductor, Walxaha molecule yar yar ee dabiiciga ah, Walxaha polymer, Walxaha isku-dhafan ee organic/aan-organic, walxo aan bir ahayn
1. Diyaarinta profile heerka wafer ee Chip iyo falanqaynta elektaroonigga ah, oo ku saleysan tikniyoolajiyada iftiinka ion diiradda (DB-FIB), goynta saxda ah ee aagga deegaanka ee chip-ka, iyo sawir-qaadista elektarooniga ah ee waqtiga-dhabta ah, waxay heli kartaa qaab-dhismeedka astaanta chip-ka, halabuurka iyo macluumaadka kale ee muhiimka ah ee habka;
2. Falanqaynta dhamaystiran ee sifooyinka jirka iyo kiimikooyinka ee qalabka wax soo saarka semiconductor, oo ay ku jiraan qalabka polymer organic, walxaha molecule yar yar, falanqaynta ka kooban walxaha aan organic-ga ah ee aan biraha ahayn, falanqaynta qaab-dhismeedka molecular, iwm;
3. Samaynta iyo hirgelinta qorshaha falanqaynta wasakhaysan ee qalabka semiconductor. Waxay ka caawin kartaa macaamiisha inay si buuxda u fahmaan sifooyinka jidheed iyo kiimikaad ee wasakhowga, oo ay ku jiraan: falanqaynta ka kooban kiimikada, falanqaynta nuxurka, falanqaynta qaabdhismeedka kelli iyo falanqaynta sifooyinka kale ee jirka iyo kiimikaad.
Adeegganooca | Adeeggaalaabta |
Falanqaynta halabuurka aasaasiga ah ee walxaha semiconductor | l falanqaynta aasaasiga ah ee EDS, l X-ray photoelectron spectroscopy (XPS) falanqaynta aasaasiga ah |
Falanqaynta qaab-dhismeedka molecular ee walxaha semiconductor | l FT-IR infrared spectrum falanqaynta, l X-ray diffraction (XRD) spectroscopic falanqaynta, l Falanqaynta dib-u-celinta dib-u-celinta nukliyeerka (H1NMR, C13NMR) |
Falanqaynta qaab-dhismeed-yar ee alaabta semiconductor | l Falanqaynta jeexjeexyada labajibbaaran ee isha lagu hayo (DBFIB), l Sawirka qiiqa hawada ee mikroskoobyada elektaroonigga ah (FESEM) ayaa loo isticmaalay in lagu cabbiro oo lagu eego qaab-dhismeedka microscopic, l Mikroskoobyada xoogga atomiga (AFM) ee fiirsashada morphology ee dusha sare |